The Scanning Electron Microscopy (SEM) is a method, which is often used for the investigation of leather, collagen or plastics/polymers if light microscopy is insufficient.

In particular that is the case if higher resolutions are needed. More preferences of scanning electron microscopy are large depth of field and high-contrast images of surface structures. Also the investigation of very dark surfaces or transparent materials is very favourable by using SEM technique.

Since April 1999 the institute had a modern scanning electron microscope (FEI Electron Optics) at one's disposal.

It allows the imaging of anorganic and organic solids, e.g. sheets, powders, leather and skins with enlargements of 10 to 100 000 at large depth of field and resolutions of about 10 nm.

The instrument of type XL 30 ESEM operates not only in the high vacuum mode but also in a diluted water vapour atmosphere. Therefore it is possible to investigate outgasing samples (e.g. leather) without large preparation expenditure or waiting time. Often it is not necessary to cover the surface of the sample with a thin electrically conductive layer by sputtering or evaporation before the observation of the sample.

In the following some application examples: